Advances in modelling electron energy loss spectra from first principles
Source abstract
Abstract
Abstract Electron energy loss (EEL) spectroscopy carried out within a (scanning) transmission electron microscope can provide chemical and bonding information with atomic resolution. The information that lies within the spectrum can be difficult to extract, and often reference spectra are used to identify atomic bonding environments. First principles simulations are able to relate features in spectra to atomistic models and are particularly important in the interpretation of spectra where there are no appropriate bulk references, such as those from nanomaterials or interfaces. This paper reviews the recent developments in first principles simulations of EEL spectra and highlights the potential for advances in our understanding of materials.
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Machine Learning in Materials Science · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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