Assessment of blind via holes – an alternative approach
Source abstract
Abstract
Purpose To present a simple way of assessing blind vias, making failure analysis easier to perform and generating less controversy. Design/methodology/approach The paper describes a procedure that may be used to examine blind via hole interconnections for routine testing or during failure analysis of a printed circuit board. Findings The technique described complements existing methods for assessing vias. Originality/value The paper details a new method of via assessment that can be an alternative to established techniques.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing · Industrial Vision Systems and Defect Detection
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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