X‐Ray Fluorescence for Coating Thickness Measurement
Source abstract
Abstract
The X‐Ray fluorescence method of coating thickness measurement of ISO 3497, BS 5411 (A), DIN 50987, and ASTM B568–79 is discussed from a practical point of view. A brief illustration of the method's technical principles, advantages, applications, and example instrumentation is given together with some of the precautions to be taken.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Advancements in Photolithography Techniques · Metal and Thin Film Mechanics
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References
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