journal article·2024-01-09Open access

Correction to “Dysprosium Incorporation for Phase Stabilization of Atomic-Layer-Deposited HfO2 Thin Films”

Yujin Lee, Kangsik Kim, Zonghoon Lee, Hong-Sub Lee, Han-Bo-Ram Lee, Woo-Hee Kim, Il-Kwon Oh, Hyungjun Kim

Chemistry of Materials· Volume 36· Issue 1

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVAddition/CorrectionNEXTORIGINAL ARTICLEThis notice is a correctionCorrection to "Dysprosium Incorporation for Phase Stabilization of Atomic-Layer-Deposited HfO2 Thin Films"Yujin LeeYujin LeeMore by Yujin Leehttps://orcid.org/0000-0002-9213-019X, Kangsik KimKangsik KimMore by Kangsik Kim, Zonghoon LeeZonghoon LeeMore by Zonghoon Leehttps://orcid.org/0000-0003-3246-4072, Hong-Sub LeeHong-Sub LeeMore by Hong-Sub Leehttps://orcid.org/0000-0001-9605-8984, Han-Bo-Ram LeeHan-Bo-Ram LeeMore by Han-Bo-Ram Leehttps://orcid.org/0000-0002-0097-6738, Woo-Hee Kim*Woo-Hee KimMore by Woo-Hee Kimhttps://orcid.org/0000-0003-0868-7479, Il-Kwon Oh*Il-Kwon OhMore by Il-Kwon Ohhttps://orcid.org/0000-0002-1266-3157, and Hyungjun Kim*Hyungjun KimMore by Hyungjun Kimhttps://orcid.org/0000-0001-5393-2053Cite this: Chem. Mater. 2024, 36, 1, 609Publication Date (Web):December 29, 2023Publication History Received9 October 2023Published online29 December 2023Published inissue 9 January 2024https://pubs.acs.org/doi/10.1021/acs.chemmater.3c02586https://doi.org/10.1021/acs.chemmater.3c02586correctionACS PublicationsCopyright © 2023 American Chemical Society. This publication is available under these Terms of Use. Request reuse permissions This publication is free to access through this site. Learn MoreArticle Views267Altmetric-Citations-LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail PDF (797 KB) Get e-Alertsclose Get e-Alerts
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OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Electronic and Structural Properties of Oxides

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References (1)

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1. 10.1021/acs.chemmater.2c0286210.1021/acs.chemmater.2c02862 ↗