Scanning Probe Microscopy Study of the Metal-Rich Layered Chalcogenides TaM₂Te₂ (M = Co, Ni)

Jörg Neuhausen; Vladimir K. Evstaf'iev; Thomas Block; E. Wolfgang Finckh; Wolfgang Tremel; Ludger Augustin; Harald Fuchs; Dirk Voss; Peter Krüger; Albert Mazur; Johannes Pollmann

doi:10.1021/cm980714x

journal article·1998-12-01

Scanning Probe Microscopy Study of the Metal-Rich Layered Chalcogenides TaM₂Te₂ (M = Co, Ni)

Jörg Neuhausen, Vladimir K. Evstaf'iev, Thomas Block, E. Wolfgang Finckh, Wolfgang Tremel, Ludger Augustin, Harald Fuchs, Dirk Voss, Peter Krüger, Albert Mazur, Johannes Pollmann

Chemistry of Materials· Volume 10· Issue 12

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Abstract

The compounds TaNi 2 Te 2 and TaCo 2 Te 2 have been examined by scanning tunneling and atomic force microscopy. The title phases crystallize in layered structures with metal slabs sandwiched by tellurium atoms. Scanning probe microscope images of the surfaces of these materials arise from the surface tellurium atoms and depending on the experimental conditions can show very different features. The images have been simulated through surface charge densities calculated within the Extended Hückel and LMTO frameworks.

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Research context

OpenAlex topics: Molecular Junctions and Nanostructures · Iron-based superconductors research · Inorganic Chemistry and Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institut für Anorganische Chemie und Analytische Chemie der Johannes Gutenberg-Universität, Becherweg 24, D-55099 Mainz, Germany, Physikalisches Institut der Westfälischen Wilhelms-Universität Münster, Wilhelm Klemm-Strasse 10, D-48149 Münster, Germany, and Institut für Theoretische Physik II-Festkörperphysik der Westfälischen Wilhelms-Universität Münster, Wilhelm Klemm-Strasse 10, D-48149 Münster, Germany

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