journal article·2022-12-27Open access

Material Perspective on HgTe Nanocrystal-Based Short-Wave Infrared Focal Plane Arrays

Huichen Zhang, Rodolphe Alchaar, Yoann Prado, Adrien Khalili, Charlie Gréboval, Mariarosa Cavallo, Erwan Bossavit, Corentin Dabard, Tung Huu Dang, Claire Abadie, Christophe Methivier, David Darson, Victor Parahyba, Pierre Potet, Julien Ramade, Mathieu G. Silly, James K. Utterback, Debora Pierucci, Sandrine Ithurria, Emmanuel Lhuillier

Chemistry of Materials· Volume 34· Issue 24

Abstract

After the use of nanocrystals as light downconverters, infrared sensing appears to be one of the first market applications where they can be used while being both electrically and optically active. Over recent years, tremendous progress has been achieved, leading to an apparent rise in the technological-readiness level (TRL). So far, the efforts have been focused on PbS nanocrystals for operation in the near-infrared. Here, we focus on HgTe since its narrower band gap offers more flexibility to explore the extended short-wave and midwave infrared. We report a photoconductive strategy for the design of short-wave infrared focal plane arrays with enhanced image quality. An important aspect often swept under the rug at an early stage is the material stability. It appears that HgTe remains mostly unaffected by oxidation under air operation. The evaporation of Hg, a potentially dramatic aging process, only occurs at temperatures far beyond the focal plane array’s standard working temperature. The main bottleneck appears to be the particle sintering resulting from joule heating of focal plane arrays. This suggests that a cooling system is required, whose first role is to prevent the material from sintering even before targeting dark current reduction.
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Research context

OpenAlex topics: Quantum Dots Synthesis And Properties · Advanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, 75005 Paris, France

Laboratoire de Physique et d’Etude des Matériaux, ESPCI-Paris, PSL Research University, Sorbonne Université Univ Paris 06, CNRS UMR 8213, 10 rue Vauquelin, 75005 Paris, France

Laboratoire de Réactivité de Surface, UMR CNRS 7197, Sorbonne Universités, 4 place Jussieu, 75005 Paris, France

Laboratoire de Physique de l’École normale supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Université Paris Cité, Sorbonne Paris Cité, 75005 Paris, France

New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France

Institut Pprime, Département Physique et Mécanique des Matériaux, UPR 3346 CNRS, Université de Poitiers, SP2MI, TSA 41123, 86073 Poitiers Cedex 9, France

Synchrotron SOLEIL, L’Orme des Merisiers, Départementale 128, 91190 Saint-Aubin, France

Université Paris-Saclay, CNRS, Centre de Nanosciences et de Nanotechnologies, 91120 Palaiseau, France

Funding

Agence Nationale de la Recherche · Conseil R?gional, ?le-de-France · China Scholarship Council · H2020 European Research Council

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