In-Depth Analysis of the Conversion Mechanism of TiSnSb vs Li by Operando Triple-Edge X-ray Absorption Spectroscopy: a Chemometric Approach
Abstract
Research context
OpenAlex topics: Semiconductor materials and interfaces · Chalcogenide Semiconductor Thin Films · Advancements in Battery Materials
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Affiliations
Dutch-Belgian (DUBBLE), ESRF-The European Synchrotron, CS 40220, 38043 Grenoble Cedex 9, France
Faculty of Applied Sciences, Delft University of Technology, Delft, Netherlands
Alistore European Research Institute, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens Cedex, France
Institut Charles Gerhardt - AIME (CNRS UMR 5253), Université de Montpellier, CC 1502, Pl. E. Bataillon, 34095 Montpellier Cedex 5, France
Reseau sur le Stockage Electrochimique de l’Energie (RS2E), CNRS FR3459, 33 Rue Saint Leu, 80039 Amiens Cedex, France
School of Physical Sciences, University of Kent, CT2 7NH Kent, United Kingdom
Funding
Sixth Framework Programme