journal article·2021-04-13

Atomic Layer Deposition of FeSe2, CoSe2, and NiSe2

Zheng Guo, Ran Zhao, Shihan Yan, Wei Xiong, Jiahao Zhu, Ke Lu, Xinwei Wang

Chemistry of Materials· Volume 33· Issue 7
Publisher page

Abstract

Atomic layer deposition (ALD) of the iron-group transition-metal diselenides FeSe2, CoSe2, and NiSe2 is reported for the first time. The ALD processes employ the associated metal amidinates as the metal precursors and diethyldiselenide (DEDSe) as the selenium precursor, together with Ar/H2 plasma for DEDSe activation. All of the ALD processes are able to grow highly pure, smooth, and crystalline MSe2 (M = Fe, Co, Ni) films with ideal layer-by-layer film growth behavior, which highlights good controllability over film quality and fabrication process as benefited from ALD. It is further demonstrated that all of the MSe2 films can be uniformly deposited into 10:1 high-aspect-ratio microtrenches with excellent conformality, which underscores the great promise of these processes for conformal MSe2 coatings on three-dimensional (3D) complex topologies in general. In situ ALD mechanism investigation further reveals that the efficient dissociation of DEDSe by plasma is key to the success of these ALD processes.
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Research context

OpenAlex topics: Semiconductor materials and devices · Electronic and Structural Properties of Oxides · Catalytic Processes in Materials Science

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Advanced Materials, Shenzhen Graduate School, Peking University, Shenzhen 518055, China

Funding

Guangdong Science and Technology Department · Science, Technology and Innovation Commission of Shenzhen Municipality · National Natural Science Foundation of China

References (77)

Show source-provided references
1. 10.2138/am-1996-1-21510.2138/am-1996-1-215 ↗
2. 10.1021/acs.chemmater.5b0356210.1021/acs.chemmater.5b03562 ↗
3. 10.1016/0038-1098(79)90647-110.1016/0038-1098(79)90647-1 ↗
4. 10.1143/JPSJ.48.85010.1143/JPSJ.48.850 ↗
5. 10.1103/PhysRevB.81.03512210.1103/PhysRevB.81.035122 ↗
6. 10.1103/PhysRevB.98.12511410.1103/PhysRevB.98.125114 ↗
7. 10.1016/S0921-4526(01)00579-810.1016/S0921-4526(01)00579-8 ↗
8. 10.1021/acsenergylett.9b0038210.1021/acsenergylett.9b00382 ↗
9. 10.1002/adma.20150019610.1002/adma.201500196 ↗
10. 10.1002/adfm.20180176510.1002/adfm.201801765 ↗
11. 10.1002/adfm.20160260810.1002/adfm.201602608 ↗
12. 10.1002/advs.20180078210.1002/advs.201800782 ↗
13. 10.1016/j.nanoen.2015.04.02710.1016/j.nanoen.2015.04.027 ↗
14. 10.1002/anie.20100703610.1002/anie.201007036 ↗
15. 10.1016/j.ensm.2017.03.00510.1016/j.ensm.2017.03.005 ↗
16. 10.1002/smll.20170097910.1002/smll.201700979 ↗
17. 10.1021/acsenergylett.0c0138510.1021/acsenergylett.0c01385 ↗
18. 10.1021/acsenergylett.6b0024610.1021/acsenergylett.6b00246 ↗
19. 10.1039/D0EE01925A10.1039/D0EE01925A ↗
20. 10.1002/anie.20180088310.1002/anie.201800883 ↗
21. 10.1016/j.apcatb.2019.11824910.1016/j.apcatb.2019.118249 ↗
22. 10.1002/anie.20150257310.1002/anie.201502573 ↗
23. 10.1038/s41598-017-02285-z10.1038/s41598-017-02285-z ↗
24. 10.1021/acsami.5b1214310.1021/acsami.5b12143 ↗
25. 10.1016/j.matlet.2016.05.08710.1016/j.matlet.2016.05.087 ↗
26. 10.1088/2053-1583/aba56610.1088/2053-1583/aba566 ↗
27. 10.1021/acs.chemmater.9b0441610.1021/acs.chemmater.9b04416 ↗
28. 10.1039/c3ee42413h10.1039/c3ee42413h ↗
29. 10.1021/ja501497n10.1021/ja501497n ↗
30. 10.1021/cr900056b10.1021/cr900056b ↗
31. 10.1039/C6MH00521G10.1039/C6MH00521G ↗
32. 10.1063/1.475790710.1063/1.4757907 ↗
33. 10.1063/1.9693010.1063/1.96930 ↗
34. 10.1007/BF0027535410.1007/BF00275354 ↗
35. 10.1088/0022-3727/42/12/12530610.1088/0022-3727/42/12/125306 ↗
36. 10.1021/ja809038810.1021/ja8090388 ↗
37. 10.1039/C5TC00533G10.1039/C5TC00533G ↗
38. 10.1088/2053-1583/3/1/01400410.1088/2053-1583/3/1/014004 ↗
39. 10.3390/electronics602002710.3390/electronics6020027 ↗
40. 10.1002/pssr.20180002310.1002/pssr.201800023 ↗
41. 10.1021/acs.chemmater.9b0208510.1021/acs.chemmater.9b02085 ↗
42. 10.1021/acsami.0c0374710.1021/acsami.0c03747 ↗
43. 10.1016/j.ccr.2013.07.00210.1016/j.ccr.2013.07.002 ↗
44. 10.1002/cplu.20200010810.1002/cplu.202000108 ↗
45. 10.1021/acs.chemmater.5b0464510.1021/acs.chemmater.5b04645 ↗
46. 10.1002/ange.20170044910.1002/ange.201700449 ↗
47. 10.1021/acsenergylett.7b0105610.1021/acsenergylett.7b01056 ↗
48. 10.1021/acs.chemmater.9b0126710.1021/acs.chemmater.9b01267 ↗
49. 10.1021/acs.chemmater.0c0250510.1021/acs.chemmater.0c02505 ↗
50. 10.1021/acs.nanolett.5b0250810.1021/acs.nanolett.5b02508 ↗
51. 10.1039/C7TA06243E10.1039/C7TA06243E ↗
52. 10.1002/anie.20180309210.1002/anie.201803092 ↗
53. 10.1021/acs.chemmater.5b0213710.1021/acs.chemmater.5b02137 ↗
54. 10.1116/1.508858210.1116/1.5088582 ↗
55. 10.1021/acs.chemmater.9b0126710.1021/acs.chemmater.9b01267 ↗
56. 10.1038/s41467-019-12992-y10.1038/s41467-019-12992-y ↗
57. 10.1002/anie.20160280210.1002/anie.201602802 ↗
58. Moulder, J. F.; Stickle, W.; Sobol, P.; Bomben, K. D. Handbook of X-Ray Photoelectron Spectroscopy; Chastain, J.; King, R. C., Eds. Physical Electronics, Inc., 1992; 1–260.
59. 10.1021/ja508515710.1021/ja5085157 ↗
60. 10.1021/acsami.5b1209310.1021/acsami.5b12093 ↗
61. 10.1002/anie.20181019910.1002/anie.201810199 ↗
62. 10.1021/acs.jpcc.8b0723010.1021/acs.jpcc.8b07230 ↗
63. 10.1021/acsaelm.9b0000610.1021/acsaelm.9b00006 ↗
64. 10.1021/acs.chemmater.8b0394010.1021/acs.chemmater.8b03940 ↗
65. 10.1039/D0NR02939D10.1039/D0NR02939D ↗
66. 10.1021/acsenergylett.9b0024910.1021/acsenergylett.9b00249 ↗
67. 10.1016/j.electacta.2020.13674210.1016/j.electacta.2020.136742 ↗
68. 10.1016/j.jallcom.2019.04.09410.1016/j.jallcom.2019.04.094 ↗
69. 10.1016/j.ijhydene.2020.07.20110.1016/j.ijhydene.2020.07.201 ↗
70. 10.1021/cr00035a00910.1021/cr00035a009 ↗
71. 10.1021/ja303560c10.1021/ja303560c ↗
72. 10.1038/nchem.185310.1038/nchem.1853 ↗
73. 10.1002/adfm.20180329110.1002/adfm.201803291 ↗
74. 10.1038/nmat446510.1038/nmat4465 ↗
75. 10.1039/C7EE03603E10.1039/C7EE03603E ↗
76. 10.1002/anie.20190668310.1002/anie.201906683 ↗
77. Wang, H. Atomic Layer Deposition of Oxides for Microelectronics. Ph.D. Thesis, Harvard University: Massachusetts, USA, 2009.