journal article·2011-06-14

In situ Reaction Mechanism Studies on Atomic Layer Deposition of Ir and IrO2 from Ir(acac)3

Kjell Knapas, Mikko Ritala

Chemistry of Materials· Volume 23· Issue 11
Publisher page

Abstract

Reaction mechanisms in three atomic layer deposition (ALD) processes using Ir(acac) 3 as a precursor were studied: Ir(acac) 3 –O 2 process at 300 °C for Ir deposition, Ir(acac) 3 –O 3 process at 195 °C for IrO 2 deposition, and Ir(acac) 3 –O 3 –H 2 process at 195 °C for Ir deposition. Reactions were studied in situ with a quadrupole mass spectrometer (QMS) and a quartz crystal microbalance (QCM). The byproducts in all processes were CO 2 and H 2 O. Only in the Ir(acac) 3 –O 2 process these were partially released during the Ir(acac) 3 pulse (14% of CO 2 and 57% of H 2 O as compared to a complete ALD cycle). To explain this, some oxygen atoms were concluded to chemisorb on the surface during the O 2 pulse. In the other two processes, the adsorption of Ir(acac) 3 appeared to be molecular on a plain surface of the film material.
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Research context

OpenAlex topics: Semiconductor materials and devices · Catalytic Processes in Materials Science · Electronic and Structural Properties of Oxides

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Affiliations

Laboratory of Inorganic Chemistry, Department of Chemistry, University of Helsinki, P.O. Box 55, FIN-00014 University of Helsinki, Finland

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