In situ Reaction Mechanism Studies on Atomic Layer Deposition of Ir and IrO2 from Ir(acac)3
Source abstract
Abstract
Reaction mechanisms in three atomic layer deposition (ALD) processes using Ir(acac) 3 as a precursor were studied: Ir(acac) 3 –O 2 process at 300 °C for Ir deposition, Ir(acac) 3 –O 3 process at 195 °C for IrO 2 deposition, and Ir(acac) 3 –O 3 –H 2 process at 195 °C for Ir deposition. Reactions were studied in situ with a quadrupole mass spectrometer (QMS) and a quartz crystal microbalance (QCM). The byproducts in all processes were CO 2 and H 2 O. Only in the Ir(acac) 3 –O 2 process these were partially released during the Ir(acac) 3 pulse (14% of CO 2 and 57% of H 2 O as compared to a complete ALD cycle). To explain this, some oxygen atoms were concluded to chemisorb on the surface during the O 2 pulse. In the other two processes, the adsorption of Ir(acac) 3 appeared to be molecular on a plain surface of the film material.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and devices · Catalytic Processes in Materials Science · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Laboratory of Inorganic Chemistry, Department of Chemistry, University of Helsinki, P.O. Box 55, FIN-00014 University of Helsinki, Finland
References (24)
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