journal article·2008-09-09

In Situ Reaction Mechanism Studies on Atomic Layer Deposition of ZrO2 from (CpMe)2Zr(OMe)Me and Water or Ozone

Kjell Knapas, Mikko Ritala

Chemistry of Materials· Volume 20· Issue 17
Publisher page

Abstract

Reaction mechanisms in the atomic layer deposition of ZrO 2 from (CpMe) 2 Zr(OMe)Me and deuterated water or ozone were studied in situ with a quadrupole mass spectrometer and a quartz crystal microbalance at 350 °C. In the D 2 O process the detected reaction byproducts were as expected MeD, MeOD, and DCpMe. About 80% of the MeD, 40% of the MeOD, and 60% of the DCpMe were formed during the (CpMe) 2 Zr(OMe)Me pulse in reactions with surface −OD groups and the rest during the D 2 O pulse. In the ozone process the most important reaction byproducts were CO 2 and H 2 O. Interestingly, about 20% of both of these were released already during the (CpMe) 2 Zr(OMe)Me pulse and the rest during the O 3 pulse. In addition, some MeH and HCpMe were formed during the (CpMe) 2 Zr(OMe)Me pulse. Furthermore, D 2 O was used to probe the state of the surface after the (CpMe) 2 Zr(OMe)Me pulse in the O 3 process. Thereby, it could be stated that about 50% of the Me− ligands, 40% of the MeO− ligands, and 60% of the −CpMe ligands were eliminated during the (CpMe) 2 Zr(OMe)Me pulse. Similarly, ZrCl 4 was used to probe the surface after the O 3 pulse. Thereby, the surface was found to be covered with only about 10% −OH concentration as compared to the water process. To explain the observations, some active oxygen was concluded to be left on the surface after the O 3 pulse.
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Research context

OpenAlex topics: Semiconductor materials and devices · Electronic and Structural Properties of Oxides · Catalytic Processes in Materials Science

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Affiliations

Laboratory of Inorganic Chemistry, Department of Chemistry, University of Helsinki, P.O. Box 55, FIN-00014 University of Helsinki, Finland

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