DataVXChemistry of MaterialsPaper
journal article·2019-10-08

Defect Heterogeneity in Monolayer WS2 Unveiled by Work Function Variance

Xinyun Wang, Jiadong Dan, Zhenliang Hu, Jin Feng Leong, Qi Zhang, Ziyu Qin, Shisheng Li, Junpeng Lu, Stephen J. Pennycook, Wanxin Sun, Chorng Haur Sow

Chemistry of Materials· Volume 31· Issue 19
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Source abstract

Abstract

Defects are commonly found in two-dimensional (2D) transition-metal dichalcogenide (TMD) materials. Such defects usually dictate the optical and electrical properties of TMDs. It is thus important to develop techniques to characterize the defects directly with good spatial resolution, specificity, and throughput. Herein, we demonstrate that Kelvin probe force microscopy (KPFM) is a versatile technique for this task. It is able to unveil defect heterogeneity of 2D materials with a spatial resolution of 10 nm and energy sensitivity better than 10 meV. KPFM mappings of monolayer WS2 exhibit interesting work function variances that are associated with defects distribution. This finding is verified by aberration-corrected scanning transmission electron microscopy and density functional theory calculations. In particular, a strong correlation among the work function, electrical and optical responses to the defects is revealed. Our findings demonstrate the potential of KPFM as an effective tool for exploring the intrinsic defects in TMDs.
Source: openalex_inverted_index · Quality: baseline

Research context

Nanomaterials

OpenAlex topics: 2D Materials and Applications · Graphene research and applications · MXene and MAX Phase Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117542

Centre for Advanced 2D Materials, National University of Singapore, 6 Science Drive 2, Singapore 117546

Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117575

State Key Laboratory of Materials Processing and Die Mould Technology, Huazhong University of Science and Technology (HUST), Wuhan, China 430074

International Centre for Young Scientists (ICYS), National Institute for Materials Science (NIMS), Tsukuba, Japan 305-0044

School of Physics, Southeast University, Nanjing, China 211189

Bruker Nano Surface Division, 30 Biopolis Street 09-01, The Matrix, Singapore 138671

Funding

Ministry of Education - Singapore · National University of Singapore

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