Comment on “Origin of Giant Dielectric Response in Nonferroelectric CaCu₃Ti₄O₁₂: Inhomogeneous Conduction Nature Probed by Atomic Force Microscopy”

ADVERTISEMENT RETURN TO ISSUEPREVCommentsNEXTComment on "Origin of Giant Dielectric Response in Nonferroelectric CaCu3Ti4O12: Inhomogeneous Conduction Nature Probed by Atomic Force Microscopy"Sung-Yoon Chung*View Author Information Department of Materials Science and Engineering, Inha University, Incheon 402-751, Korea, and Nalphates LLC, Wilmington, Delaware 19801* E-mail: [email protected] and [email protected]Cite this: Chem. Mater. 2008, 20, 19, 6284–6285Publication Date (Web):September 3, 2008Publication History Published online3 September 2008Published inissue 14 October 2008https://pubs.acs.org/doi/10.1021/cm801275khttps://doi.org/10.1021/cm801275karticle-commentaryACS PublicationsCopyright © 2008 American Chemical Society. This publication is available under these Terms of Use. Request reuse permissions This publication is free to access through this site. Learn MoreArticle Views658Altmetric-Citations10LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail PDF (145 KB) Get e-AlertscloseSUBJECTS:Carrier dynamics,Electrical conductivity,Grain,Grain boundaries,Oxides Get e-Alerts