journal article·2018-12-26

Quantifying the Exfoliation Ease Level of 2D Materials via Mechanical Anisotropy

Li-Jun Ji, Yan Qin, Di Gui, Wei Li, Yanchun Li, Xiaodong Li, Peixiang Lu

Chemistry of Materials· Volume 30· Issue 24
Publisher page

Abstract

The isolation of 2D materials from mother bulks into nanoscale is of vital importance for fulfilling their applications in many technological fields. Among known methods, mechanical exfoliation is one of the most widely utilized ways due to its simplicity. For a given 2D material, both its interlayer and its intralayer bonding strengths need to be taken into account for understanding the exfoliation process as the former dominates the ease level for cleaving adjacent molecular layers while the latter regulates the ability to resist cracking. In this regard, strong intralayer but weak interlayer bonding interactions respectively lead to large and thin nanosheets and, hence, facile exfoliation (and vice versa). As the bonding forces can be directly reflected through elastic properties of materials, here we propose to use the ratio between the in-plane and out-of-plane elastic modulus (E) as a universal index, AIn/Out (= EIn-plane/EOut-of-plane), to quantify the ease level of a 2D material’s mechanical exfoliation. Such ratios, which can be facilely obtained from routine computational and mechanical experiments, could provide useful information for estimating suitable exfoliation methods of 2D materials.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Graphene research and applications · 2D Materials and Applications · MXene and MAX Phase Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Physics and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China

School of Materials Science and Engineering & National Institute for Advanced Materials, Nankai University, Tianjin 300350, China

Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China

Laboratory for Optical Information Technology, Wuhan Institute of Technology, Wuhan 430205, China

Funding

National Natural Science Foundation of China

References (35)

Show source-provided references
1. 10.1126/science.110289610.1126/science.1102896 ↗
2. 10.1002/adom.20160104510.1002/adom.201601045 ↗
3. 10.1038/s41570-016-001410.1038/s41570-016-0014 ↗
4. 10.1021/ja312567v10.1021/ja312567v ↗
5. 10.1016/j.ccr.2015.12.00110.1016/j.ccr.2015.12.001 ↗
6. 10.1021/jp036354510.1021/jp0363545 ↗
7. 10.1126/science.122641910.1126/science.1226419 ↗
8. 10.1021/nl302584w10.1021/nl302584w ↗
9. 10.1016/j.actamat.2009.04.00410.1016/j.actamat.2009.04.004 ↗
10. 10.1039/B612389A10.1039/B612389A ↗
11. 10.1021/nn204054k10.1021/nn204054k ↗
12. 10.1126/science.aac766010.1126/science.aac7660 ↗
13. 10.1126/science.125422710.1126/science.1254227 ↗
14. 10.1088/2053-1583/aa57ff10.1088/2053-1583/aa57ff ↗
15. 10.1039/C3NR06919B10.1039/C3NR06919B ↗
16. 10.1038/srep0673510.1038/srep06735 ↗
17. 10.1021/acsnano.5b0722810.1021/acsnano.5b07228 ↗
18. 10.1021/nl070613a10.1021/nl070613a ↗
19. 10.1016/j.carbon.2008.06.02210.1016/j.carbon.2008.06.022 ↗
20. 10.1088/0957-4484/27/12/12570410.1088/0957-4484/27/12/125704 ↗
21. 10.1103/PhysRevB.8.371910.1103/PhysRevB.8.3719 ↗
22. 10.1021/ar400231210.1021/ar4002312 ↗
23. 10.1038/srep3515410.1038/srep35154 ↗
24. 10.1088/2053-1583/2/2/02100110.1088/2053-1583/2/2/021001 ↗
25. 10.1016/j.commatsci.2017.09.01410.1016/j.commatsci.2017.09.014 ↗
26. 10.1063/1.165942810.1063/1.1659428 ↗
27. 10.1016/0022-3697(76)90143-810.1016/0022-3697(76)90143-8 ↗
28. 10.1063/1.488521510.1063/1.4885215 ↗
29. 10.1103/PhysRevB.86.03510510.1103/PhysRevB.86.035105 ↗
30. 10.1002/anie.20120500210.1002/anie.201205002 ↗
31. 10.1021/acs.jpclett.7b0322910.1021/acs.jpclett.7b03229 ↗
32. 10.1016/j.commatsci.2011.12.02910.1016/j.commatsci.2011.12.029 ↗
33. 10.1016/j.ssc.2014.02.01210.1016/j.ssc.2014.02.012 ↗
34. 10.1038/s41565-017-0035-510.1038/s41565-017-0035-5 ↗
35. 10.1063/1.504264510.1063/1.5042645 ↗