journal article·2006-08-01

Highly Stable Monolayer Resists for Atomic Layer Deposition on Germanium and Silicon

Rong Chen, Stacey F. Bent

Chemistry of Materials· Volume 18· Issue 16
Publisher page

Abstract

In this paper, 1-alkenes and 1-alkynes are investigated for a new class of monolayer resists formed on the hydrogen-terminated surfaces of both germanium and silicon. A series of 1-alkenes and 1-alkynes with different chain lengths are explored as deactivating agents for atomic layer deposition of HfO 2 and Pt films. It is shown that to achieve satisfactory blocking of atomic layer deposition, densely packed, highly hydrophobic monolayers must be formed. A mechanism for the film formation and blocking processes is discussed and compared with that of alkylsilane-based self-assembled monolayer resists.
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Research context

OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Molecular Junctions and Nanostructures

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Affiliations

Department of Chemistry and Department of Chemical Engineering, Stanford University, Stanford, California 94305

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