journal article·2017-02-14Open access

Area-Selective Atomic Layer Deposition of In2O3:H Using a μ-Plasma Printer for Local Area Activation

Alfredo Mameli, Yinghuan Kuang, Morteza Aghaee, Chaitanya K. Ande, Bora Karasulu, Mariadriana Creatore, Adriaan J. M. Mackus, Wilhelmus M. M. Kessels, Fred Roozeboom

Chemistry of Materials· Volume 29· Issue 3

Abstract

Researchers present a novel method for area-selective atomic layer deposition (AS-ALD) large-area electronics. It is a direct-write ALD process of In2O3:H, a highly promising and relevant transparent conductive oxide (TCO) material which makes use of printing technology for surface activation. first the surface of H-terminated silicon materials is locally activated by a μ-plasma printer in air or O2, and In2O3:H is deposited selectively on the activated areas. The selectivity stems from the fact that ALD In2O3:H leads to very long nucleation delays on H-terminated silicon materials.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: ZnO doping and properties · Semiconductor materials and devices · Thin-Film Transistor Technologies

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Affiliations

Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands

Department Thin Film Technology, TNO, High Tech Campus 21, 5656 AE Eindhoven, The Netherlands

Funding

Nederlandse Organisatie voor Toegepast Natuurwetenschappelijk Onderzoek

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