journal article·1997-10-01

Copper Dissolution in Aqueous Ammonia-Containing Media during Chemical Mechanical Polishing

Q. Luo, R. A. Mackay, S. V. Babu

Chemistry of Materials· Volume 9· Issue 10
Publisher page

Abstract

Copper dissolution in ammonia-containing media during chemical-mechanical polishing (CMP) was investigated. Both a stationary and a rotating disk electrode (RDE) were used for electrochemical characterization. Ammonia can etch copper in the presence of oxidizers by dissolving the oxide film on the copper surface and the dissolution rate varied from about 8 to 30 nm/min, depending on the hydrodynamic conditions. The copper dissolution rate in NH 4 NO 3 or (NH 4 ) 2 SO 4 solution does not vary significantly with solution pH. Ammonium nitrate results in a higher dissolution rate, due to the extra oxidizing power of the nitrate ion. The addition of an inhibitor, benzotriazole (BTA), reduces the copper dissolution rate significantly, even though the dissolution rate can be increased by rotating the copper disk. The dissolution of copper in stagnant aqueous ammonia solutions is controlled by oxygen diffusion at high NH 4 OH concentrations and by mixed kinetics at low NH 4 OH concentrations (≤0.3 wt %).
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Surface Polishing Techniques · Advanced Machining and Optimization Techniques · Corrosion Behavior and Inhibition

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Chemical Engineering and Center for Advanced Materials Processing, Clarkson University, Potsdam, New York 13699

References (21)

Show source-provided references
1. Hu C. K. · J. Thin Solid Films · 1995 · 262 · 8410.1016/0040-6090(94)05807-5 ↗
2. Lakshminarayanan S. · IEEE Electron. Dev. Lett. · 1994 · 15 · 30710.1109/55.296225 ↗
3. Luo Q.
4. Luo Q. · Langmuir · 1996 · 12 · 356310.1021/la960062w ↗
5. Stavreva Z. · Appl. Surf. Sci. · 1995 · 91 · 19210.1016/0169-4332(95)00118-2 ↗
6. Hirabayashi H.
7. Gutmann R. J. · Thin Solid Film · 1995 · 270 · 59610.1016/0040-6090(95)06717-5 ↗
8. Carpio R. · Thin Solid Films · 1995 · 266 · 23810.1016/0040-6090(95)06649-7 ↗
9. Steigerwald J. M. · J. Electrochem. Soc. · 1994 · 141 · 284210.1149/1.2059241 ↗
10. Steigerwald J. M. · J. Electrochem. Soc. · 1994 · 141 · 351210.1149/1.2059362 ↗
11. Steigerwald J. M. · J. Electrochem. Soc. · 1995 · 142 · 237910.1149/1.2044305 ↗
12. Steigerwald J. M. · J. Vac. Sci. Technol. · 1995 · 13 · 221510.1116/1.588106 ↗
13. Steigerwald J. M. · J. Mater. Chem. Phys. · 1995 · 41 · 21710.1016/0254-0584(95)01516-7 ↗
14. Halpern J. · J. Electrochem. Soc. · 1953 · 100 · 42110.1149/1.2780873 ↗
15. Fisher J. I. · J. Electrochem. Soc. · 1956 · 103 · 28210.1149/1.2430311 ↗
16. Guan Y. C. · J. Electrochem. Soc. · 1995 · 142 · 1919
17. Stern M. · J. Electrochem. Soc. · 1957 · 104 · 5610.1149/1.2428496 ↗
18. Cook L. · J. Non-Cryst. Solids · 1990 · 120 · 15210.1016/0022-3093(90)90200-6 ↗
19. Liddell K. C. · Metall. Trans. B · 1991 · 12 · 62710.1007/BF02654130 ↗
20. Fontana, M. G.; Staehle, R. W.Advances in Corrosion Science andTechnology; Plenum Press: New York, 1970; Vol. 1, pp 147−218.10.1007/978-1-4615-8252-6 ↗
21. Brusic V. · J. Electrochem. Soc. · 1991 · 138 · 225310.1149/1.2085957 ↗