journal article·2023-07Open access

Structural, optical and electrical properties of copper oxide thin films deposited by spray pyrolysis

LRPCSI Laboratory, University 20 Août 1955-Skikda, Faculty of Sciences, P.B. 26, Road d’El-Hadaiek, 21000, Skikda, Algeria, N. Alouche, B. Boudjema, LRPCSI Laboratory, University 20 Août 1955-Skikda, Faculty of Sciences, P.B. 26, Road d’El-Hadaiek, 21000, Skikda, Algeria, R. Daira, LRPCSI Laboratory, University 20 Août 1955-Skikda, Faculty of Sciences, P.B. 26, Road d’El-Hadaiek, 21000, Skikda, Algeria, M. Abdelkader, Laboratory of Materials Physics and its Applications, University of M’sila, 28000 M’sila, Algeria

Journal of Ovonic Research· Volume 19· Issue 4

Abstract

In this work, we have developed thin layers of CuO by method of pyrolysis spray. The samples developed are obtained from the use of copper chloride precursor CuCl2 with molarity of 0.1 mol/l and a spray number that varies between 25 to 150 spray with a step of 25 spray to see the effect of this parameter on the structural, optical and electrical properties of our material. The structural characterization of the obtained thin layers was done by X-ray diffraction (XDR) and spectroscopy Raman. The optical characterization was done by UV visible spectroscopy and electrical characterization by four points. The XDR has confirmed the crystalline state of our thin layers and the formation of the CuO with a preferential direction according to the plan (002). The Raman spectroscopy allowed us to confirm the presence of a thin layer based on the CuO. The lattice parameters remain mainly constant. The spectra UV visible of films has given a transmission varies between 80% and 40% in visible. The optical gap determined varies between 1.75 eV and 1.2 eV. Electrical characterization shows that the resistivity varied between 3.21KΩ.cm and 1.7KΩ.cm depending on number of spray for ethanol gas sensing applications.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Copper-based nanomaterials and applications · ZnO doping and properties · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (43)

Show source-provided references
1. [1] D.P. Singh, N. Ali, Science of Advanced Materials, 2 (2010) 295-335; https://doi.org/10.1166/sam.2010.109510.1166/sam.2010.1095 ↗
2. [2] H. Kidowaki, T. Oku, T. Akiyama, A. Suzuki, B. Jeyadevan, J. Cuya, Journal of Materials Science Research, 1 (2012) 138; https://doi.org/10.5539/jmsr.v1n1p13810.5539/jmsr.v1n1p138 ↗
3. [3] K. Zhou, Y. Li, AngewandteChemie International Edition, 51 (2012) 602-613; https://doi.org/10.1002/anie.20110261910.1002/anie.201102619 ↗
4. [4] B.J. Hansen, N. Kouklin, G. Lu, I.-K. Lin, J. Chen, X. Zhang, The Journal of Physical Chemistry C, 114 (2010) 2440-2447; https://doi.org/10.1021/jp908850j10.1021/jp908850j ↗
5. [5] W. Yin, J. Yang, K. Zhao, A. Cui, J. Zhou, W. Tian, W. Li, Z. Hu, J. Chu, ACS applied materials & interfaces, 12 (2020) 11797-11805; https://doi.org/10.1021/acsami.9b1866310.1021/acsami.9b18663 ↗
6. [6] X. Zheng, C. Xu, Y. Tomokiyo, E. Tanaka, H. Yamada, Y. Soejima, Physical Review Letters, 85 (2000) 5170; https://doi.org/10.1103/PhysRevLett.85.517010.1103/PhysRevLett.85.5170 ↗
7. [7] J. Alcalà, M. Roig, S. Martín, A. Barrera, A. Fernández-Rodríguez, A. Pomar, L. Balcells, M. Coll, N. Mestres, A. Palau, Nanoparticles and Nano-composites, Springer, 2021, pp. 167-182; https://doi.org/10.1007/978-3-030-74073-3_710.1007/978-3-030-74073-3_7 ↗
8. [8] M.A. Ávila-López, S. Gavrielides, X. Luo, A.E. Ojoajogwu, J.Z. Tan, E. Luévano-Hipólito, L.M. Torres-Martínez, M.M. Maroto-Valer, Journal of CO2 Utilization, 50 (2021) 101588; https://doi.org/10.1016/j.jcou.2021.10158810.1016/j.jcou.2021.101588 ↗
9. [9] R.V. Kumar, Y. Diamant, A. Gedanken, Chemistry of Materials, 12 (2000) 2301-2305; https://doi.org/10.1021/cm000166z10.1021/cm000166z ↗
10. [10] A. Chowdhuri, V. Gupta, K. Sreenivas, R. Kumar, S. Mozumdar, P. Patanjali, Applied Physics Letters, 84 (2004) 1180-1182; https://doi.org/10.1063/1.164676010.1063/1.1646760 ↗
11. [11] X. Guo, J. Wu, L. Xia, M. Xiang, F. Qu, J. Li, Science China Chemistry, 63 (2020) 1012- 1018; https://doi.org/10.1007/s11426-020-9717-810.1007/s11426-020-9717-8 ↗
12. [12] K. Han, M. Tao, Solar Energy Materials and Solar Cells, 93 (2009) 153-157; https://doi.org/10.1016/j.solmat.2008.09.02310.1016/j.solmat.2008.09.023 ↗
13. [13] T.D. Golden, M.G. Shumsky, Y. Zhou, R.A. VanderWerf, R.A. Van Leeuwen, J.A. Switzer, Chemistry of Materials, 8 (1996) 2499-2504; https://doi.org/10.1021/cm960209510.1021/cm9602095 ↗
14. [14] A. Chen, H. Long, X. Li, Y. Li, G. Yang, P. Lu, Vacuum, 83 (2009) 927-930; https://doi.org/10.1016/j.vacuum.2008.10.00310.1016/j.vacuum.2008.10.003 ↗
15. [15] J. Chen, F. Zhang, J. Wang, G. Zhang, B. Miao, X. Fan, D. Yan, P. Yan, Journal of Alloys and Compounds, 454 (2008) 268-273; https://doi.org/10.1016/j.jallcom.2006.12.03210.1016/j.jallcom.2006.12.032 ↗
16. [16] J. Morales, L. Sánchez, F. Martín, J.R. Ramos-Barrado, M. Sánchez, Electrochimicaacta, 49 (2004) 4589-4597; https://doi.org/10.1016/j.electacta.2004.05.01210.1016/j.electacta.2004.05.012 ↗
17. [17] B. Balamurugan, B. Mehta, Thin solid films, 396 (2001) 90-96; https://doi.org/10.1016/S0040-6090(01)01216-010.1016/S0040-6090(01)01216-0 ↗
18. [18] N. Serin, T. Serin, Ş. Horzum, Y. Celik, Semiconductor science and technology, 20 (2005) 398; https://doi.org/10.1088/0268-1242/20/5/01210.1088/0268-1242/20/5/012 ↗
19. [19] E. Nicollian, JR Brews in MOS Physics and Technology, in, Wiley, New, 1982.
20. [20] A.S. Grove, Physics and technology of semiconductor devices, (1967).
21. [21] S. Kose, E. Ketenci, V. Bilgin, F. Atay, I. Akyuz, Current Applied Physics, 12 (2012) 890- 895; https://doi.org/10.1016/j.cap.2011.12.00410.1016/j.cap.2011.12.004 ↗
22. [22] D. Volanti, D. Keyson, L. Cavalcante, A.Z. Simões, M. Joya, E. Longo, J.A. Varela, P. Pizani, A. Souza, Journal of Alloys and Compounds, 459 (2008) 537-542; https://doi.org/10.1016/j.jallcom.2007.05.02310.1016/j.jallcom.2007.05.023 ↗
23. [23] H. Fan, B. Zou, Y. Liu, S. Xie, Nanotechnology, 17 (2006) 1099; https://doi.org/10.1088/0957-4484/17/4/04210.1088/0957-4484/17/4/042 ↗
24. [24] T. Yu, C.-H. Sow, A. Gantimahapatruni, F.-C. Cheong, Y. Zhu, K.-C. Chin, X. Xu, C.-T. Lim, Z. Shen, J.T.-L. Thong, Nanotechnology, 16 (2005) 1238; https://doi.org/10.1088/0957- 4484/16/8/04310.1088/0957-4484/16/8/043 ↗
25. [25] A. Chaturvedi, V. Sathe, Thickness Dependent X-Ray and Raman Studies of PrMnO3 Thin Films.
26. [26] S. Kulkarni, Y. Navale, S. Navale, F. Stadler, N. Ramgir, V. Patil, Sensors and Actuators B: Chemical, 288 (2019) 279-288; https://doi.org/10.1016/j.snb.2019.02.09410.1016/j.snb.2019.02.094 ↗
27. [27] T. Kimura, Y. Sekio, H. Nakamura, T. Siegrist, A. Ramirez, Nature materials, 7 (2008) 291- 294; https://doi.org/10.1038/nmat212510.1038/nmat2125 ↗
28. [28] F.Ö. Kuş, T. Serin, N. Serin, Journal of Optoelectronics and Advanced Materials 11, 1855 (2009).
29. [29] M. Rashad, D. Rayan, A. Ramadan, Journal of Materials Science: Materials in Electronics, 24 (2013) 2742-2749; https://doi.org/10.1007/s10854-013-1164-810.1007/s10854-013-1164-8 ↗
30. [30] J. Morales, L. Sanchez, F. Martin, J. Ramos-Barrado, M. Sanchez, Thin solid films, 474 (2005) 133-140; https://doi.org/10.1016/j.tsf.2004.08.07110.1016/j.tsf.2004.08.071 ↗
31. [31] R. Shabu, A. Moses Ezhil Raj, C. Sanjeeviraja, C. Ravidhas, Mater. Res. Bull., (2015) 1; https://doi.org/10.1016/j.materresbull.2015.03.01610.1016/j.materresbull.2015.03.016 ↗
32. [32] R. Daira, A. Kabir, B. Boudjema, C. Sedrati, Solid State Sciences, 104 (2020) 106254; https://doi.org/10.1016/j.solidstatesciences.2020.10625410.1016/j.solidstatesciences.2020.106254 ↗
33. [33] B. Boudjema, R. Daira, A. Kabir, R. Djebien, Materials Science Forum, Trans Tech Publ, 2017, pp. 33-36; https://doi.org/10.4028/www.scientific.net/MSF.895.3310.4028/www.scientific.net/MSF.895.33 ↗
34. [34] J.I. Pankove, Optical processes on semiconductors Dover publication, Inc. New york, (1971).
35. [35] A. Moumen, B. Hartiti, E. Comini, El khalidi, Z.; Arachchige, HMMM; Fadili, S.; Thevenin, P., SuperlatticesMicrostruct, 127 (2019) 2-10; https://doi.org/10.1016/j.spmi.2018.06.06110.1016/j.spmi.2018.06.061 ↗
36. [36] A.A. Al-Ghamdi, M. Khedr, M.S. Ansari, P. Hasan, M.S. Abdel-Wahab, A. Farghali, Physica E: Low-dimensional Systems and Nanostructures, 81 (2016) 83-90; https://doi.org/10.1016/j.physe.2016.03.00410.1016/j.physe.2016.03.004 ↗
37. [37] Y. Yasaki, N. Sonoyama, T. Sakata, Journal of Electroanalytical Chemistry, 469 (1999) 116- 122; https://doi.org/10.1016/S0022-0728(99)00184-910.1016/S0022-0728(99)00184-9 ↗
38. [38] P. Ooi, S. Ng, M. Abdullah, H.A. Hassan, Z. Hassan, Materials Chemistry and Physics, 140 (2013) 243-248; https://doi.org/10.1016/j.matchemphys.2013.03.02810.1016/j.matchemphys.2013.03.028 ↗
39. [39] V. Dhanasekaran, T. Mahalingam, R. Chandramohan, J.-K. Rhee, J. Chu, Thin Solid Films, 520 (2012) 6608-6613; https://doi.org/10.1016/j.tsf.2012.07.02110.1016/j.tsf.2012.07.021 ↗
40. [40] D.S. Murali, S. Kumar, R. Choudhary, A.D. Wadikar, M.K. Jain, A. Subrahmanyam, AIP advances, 5 (2015) 047143; https://doi.org/10.1063/1.491932310.1063/1.4919323 ↗
41. [41] J. Sengupta, R. Sahoo, K. Bardhan, C. Mukherjee, Materials Letters, 65 (2011) 2572-2574; https://doi.org/10.1016/j.matlet.2011.06.02110.1016/j.matlet.2011.06.021 ↗
42. [42] R. Hong, J. Huang, H. He, Z. Fan, J. Shao, Applied Surface Science, 242 (2005) 346-352; https://doi.org/10.1016/j.apsusc.2004.08.03710.1016/j.apsusc.2004.08.037 ↗
43. [43] C.R. Dhas, D. Alexander, A.J. Christy, K. Jeyadheepan, A.M.E. Raj, C.S. Raja, Asian Journal of Applied Sciences, 7 (2014) 671-684; https://doi.org/10.3923/ajaps.2014.671.68410.3923/ajaps.2014.671.684 ↗