OPTICAL AND STRUCTURAL PERFORMANCE OF NANOSTRUCTURED Te THIN FILMS BY (CSP) WITH VARIOUS THICKNESSES
Source abstract
Abstract
In this study, were investigated structural, optical properties and morphological of Te Nano-thin films with different thicknesses by Chemical spray pyrolysis (CSP) method. The structural properties of the films were studied as a Te dopant at 150-450 thicknesses. The films were characterized by XRD to study film structure. It was observed that the hexagonal wurtzite structure of ZnO for all samples. The films exhibited wurtzite (102) preferential growth in different thicknesses. Grain size values calculated from Scherrer’s formula, were varied in range of (96-84) nm. The band gap energy values were calculated respectively for Te thickness samples
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Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Copper-based nanomaterials and applications
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